Documents publiés en "1992"

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Nombre de documents: 10

Ghannouchi, F., & Bosisio, R. (1992). An automated millimeter-wave active load-pull measurement system based on six-port techniques. IEEE Transactions on Instrumentation and Measurement, 41(6), 957-962. Lien externe

Ghannouchi, F., & Bosisio, R. (1992). Source-pull/load-pull oscillator measurements at microwave/MM wave frequencies. IEEE Transactions on Instrumentation and Measurement, 41(1), 32-35. Lien externe

Ghannouchi, F., & Bosisio, R. (mai 1992). A millimeter wave active load-pull measurement system [Communication écrite]. Instrumentation and Measurement Technology Conference, Metropolitan NY, USA. Lien externe

Kauouby, L., Levesque, D., & Bosisio, R. (août 1992). Precise design of multilayer circuit using finite differences techniques [Communication écrite]. Symposium on Antenna Technology and Applied Electromagnetics, Winnipeg, MB, Canada. Lien externe

Khebir, A., Kouki, A. B., Ghannouchi, F., & Bosisio, R. (août 1992). On the use of the finite element method for RCS computation [Communication écrite]. Symposium on Antenna Technology and Applied Electromagnetics, Winnipeg, MB, Canada. Lien externe

Xu, Y., & Bosisio, R. (1992). Analysis of microstrip circular rings for MIC, MHMIC, and MMIC components. Microwave and Optical Technology Letters, 5(12), 615-617. Lien externe

Xu, Y., & Bosisio, R. (1992). Calculation of characteristic impedance of curved microstrip lines for MMIC and MHMIC. Electronics Letters, 28(8), 775-776. Lien externe

Xu, Y., & Bosisio, R. (1992). On the Measurement of Resistive Thin Films and Dielectric Slabs Using Open-Ended Coaxial Lines. Journal of Electromagnetic Waves and Applications, 6(7), 1247-1258. Lien externe

Xu, Y., & Bosisio, R. (1992). On the Measurement of Resistive Thin Films and Dielectric Slabs Using Open-Ended Coaxial Lines. Journal of Electromagnetic Waves and Applications, 6(9), 1247-1258. Lien externe

Xu, Y., Ghannouchi, F., & Bosisio, R. (1992). Theoretical and experimental study of measurement of microwave permittivity using open ended elliptical coaxial probes. IEEE Transactions on Microwave Theory and Techniques, 40(1), 143-150. Lien externe

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