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Hamida, N. B., & Kamińska, B. (juin 1991). A uniform testability measures representation for sequential and combinational circuits [Communication écrite]. International Symposium on Circuits and Systems (ISCAS 1991), Singapore. Lien externe
Savaria, Y., Youssef, M., Kamińska, B., & Koudil, M. (juin 1991). Automatic test point insertion for pseudo-random testing [Communication écrite]. International Symposium on Circuits and Systems (ISCAS 1991), Singapore. Lien externe
Hamida, N. B., & Kamińska, B. (juin 1991). A uniform testability measures representation for sequential and combinational circuits [Communication écrite]. International Symposium on Circuits and Systems (ISCAS 1991), Singapore. Lien externe