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Kamińska, B., & Savaria, Y. (août 1989). Design-for-testability using test design yield and decision theory [Communication écrite]. International Test Conference 1989, Washington, DC, USA. Lien externe
Savaria, Y., Laguë, B., & Kamińska, B. (août 1989). A pragmatic approach to the design of self-testing circuits [Communication écrite]. International Test Conference 1989, Washington, DC, USA. Lien externe
