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da Silva Sobrinho, A. S., Chasle, J., Dennler, G., & Wertheimer, M. R. (1998). Characterization of defects in PECVD-SiO₂ coatings on PET by confocal microscopy. Plasmas and Polymers, 3(4), 231-247. Lien externe
da Silva Sobrinho, A. S., Czeremuszkin, G., Latreche, M., & Wertheimer, M. R. Detection and characterization of defects in transparent barrier coatings [Communication écrite]. Annual Technical Conference - Society of Vacuum Coaters. Lien externe
da Silva Sobrinho, A. S., Bergeron, A., Schuhler, N., Sapieha, J.-E., Martinu, L., Wertheimer, M. R., & Andrews, M. (avril 1998). Interphase characterization of PECVD silicon-compound layers on PET [Communication écrite]. 41st Annual Technical Conference, Boston, MA, USA. Non disponible
da Silva Sobrinho, A. S., Latreche, M., Czeremuszkin, G., Sapieha, J.-E., & Wertheimer, M. R. (avril 1998). Transparent barrier coatings on PET by single- and dual-frequency PECVD [Communication écrite]. 41st Annual Technical Conference, Boston, MA, USA. Non disponible
Schuhler, N., da Silva Sobrinho, A. S., Sapieha, J.-E., Andrews, M., & Wertheimer, M. R. (avril 1997). Interphase characterization of silicon-based barrier layers on PET [Communication écrite]. ACS San Francisco Meeting, San Francisco, CA, USA. Non disponible
Schühler, N., da Silva Sobrinho, A. S., Sapieha, J.-E., Andrews, M., & Wertheimer, M. R. (mai 1996). ATR-FTIR spectroscopic studies of PET coated with thin SiO₂ barrier layers [Communication écrite]. SVC Technical Conference, Philadelphia, PA.. Lien externe