A. S. da Silva Sobrinho, A. Bergeron, N. Schuhler, Jolanta-Ewa Sapieha
, Ludvik Martinu, Michael R. Wertheimer and M. Andrews
Paper (1998)
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| Additional Information: | Nom historique du département: Département de génie physique et de génie des matériaux |
|---|---|
| Department: | Department of Engineering Physics |
| PolyPublie URL: | https://publications.polymtl.ca/29748/ |
| Conference Title: | 41st Annual Technical Conference |
| Conference Location: | Boston, MA, USA |
| Conference Date(s): | 1998-04-18 - 1998-04-23 |
| Date Deposited: | 18 Apr 2023 15:23 |
| Last Modified: | 25 Sep 2024 16:11 |
| Cite in APA 7: | da Silva Sobrinho, A. S., Bergeron, A., Schuhler, N., Sapieha, J.-E., Martinu, L., Wertheimer, M. R., & Andrews, M. (1998, April). Interphase characterization of PECVD silicon-compound layers on PET [Paper]. 41st Annual Technical Conference, Boston, MA, USA. |
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