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Assali, S., Bergamaschini, R., Scalise, E., Verheijen, M. A., Albani, M., Dijkstra, A., Li, A., Koelling, S., Bakkers, E. P. A. M., Montalenti, F., & Miglio, L. (2020). Kinetic Control of Morphology and Composition in Ge/GeSn Core/Shell Nanowires. ACS Nano, 14(2), 2445-2455. Lien externe
Kölling, S., Plantenga, R. C., Hauge, H. I. T., Ren, Y., Li, A., Verheijen, M. A., Conesa Boj, S., Assali, S., Koenraad, P. M., & Bakkers, E. P. A. M. (octobre 2016). Impurity and defect monitoring in hexagonal Si and SiGe nanocrystals [Communication écrite]. Symposium on SiGe, Ge, and Related Materials: Materials, Processing, and Devices 7 (PRiME 2016)/230th ECS Meeting, Honolulu, HI. Publié dans ECS Transactions, 75(8). Lien externe
