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Cicoira, F., Leifer, K., Hoffmann, P., Utke, I., Dwir, B., Laub, D., Buffat, P. A., Kapon, E., & Doppelt, P. (2004). Electron beam induced deposition of rhodium from the precursor [RhCl(PF3)2]2: Morphology, structure and chemical composition. Journal of Crystal Growth, 265(3-4), 619-626. Lien externe
Utke, I., Cicoira, F., Jaenchen, G., Hoffmann, P., Scandella, L., Dwir, B., Kapon, E., Laub, D., Buffat, P., Xanthopoulos, N., & Mathieu, H. J. (novembre 2001). Focused electron beam induced deposition of high resolution magnetic scanning probe tips [Communication écrite]. Making Functional Materials with Nanotubes (Symposium Z), Boston, MA, United states. Lien externe
Utke, I., Dwir, B., Leifer, K., Cicoira, F., Doppelt, P., Hoffmann, P., & Kapon, E. (septembre 1999). Electron beam induced deposition of metallic tips and wires for microelectronics applications [Communication écrite]. 25th International Conference on Micro- and Nano-Engineering. Publié dans Microelectronic Engineering, 53(1-4). Lien externe
Hoffmann, P., Utke, I., Cicoira, F., Dwir, B., Leifer, K., Kapon, E., & Doppelt, P. (avril 2000). Focused electron beam induced deposition of gold and rhodium [Communication écrite]. Materials Development for Direct Write Technologies (Symposium V), Warrendale, PA, USA. Lien externe