Items where Author is "Kölling, Sebastian"

A

Assali, S., Albani, M., Bergamaschini, R., Verheijen, M., Li, A., Kölling, S., Gagliano, L., Bakkers, E. P. A. M., & Miglio, L. (2019). Strain engineering in Ge/GeSn core/shell nanowires. Applied Physics Letters, 115(11), 5 pages. External link

B

Bergamaschini, R., Plantenga, R. C., Albani, M., Scalise, E., Ren, Y., Hauge, H. I. T., Kölling, S., Montalenti, F., Bakkers, E. P. A. M., Verheijen, M. A., & Miglio, L. (2021). Prismatic Ge-rich inclusions in the hexagonal SiGe shell of GaP-Si-SiGe nanowires by controlled faceting. Nanoscale, 13(20), 9436-9445. External link

F

Fadaly, E. M. T., Dijkstra, A., Suckert, J. R., Ziss, D., van Tilburg, M. A. J., Mao, C., Ren, Y., van Lange, V. T., Korzun, K., Kölling, S., Verheijen, M. A., Busse, D., Rödl, C., Furthmüller, J., Bechstedt, F., Stangl, J., Finley, J. J., Botti, S., Haverkort, J. E. M., & Bakkers, E. P. A. M. (2020). Direct-bandgap emission from hexagonal Ge and SiGe alloys. Nature, 580(7802), 205-209. External link

K

Kölling, S., Plantenga, R. C., Hauge, H. I. T., Ren, Y., Li, A., Verheijen, M. A., Conesa Boj, S., Assali, S., Koenraad, P. M., & Bakkers, E. P. A. M. (2016, October). Impurity and defect monitoring in hexagonal Si and SiGe nanocrystals [Paper]. Symposium on SiGe, Ge, and Related Materials: Materials, Processing, and Devices 7 (PRiME 2016)/230th ECS Meeting, Honolulu, HI. Published in ECS Transactions, 75(8). External link

R

Rossi, M., van Schijndel, T. A. J., Lueb, P., Badawy, G., Jung, J., Peeters, W. H. J., Kölling, S., Moutanabbir, O., Verheijen, M. A., & Bakkers, E. P. A. M. (2024). Stemless InSb nanowire networks and nanoflakes grown on InP. Nanotechnology, 35(41), 415602 (11 pages). Available