 | Monter d'un niveau |
Boudjella, A., Jin, Z. F., & Savaria, Y. (2004). Electrical Field Analysis of Nanoscale Field Effect Transistors. Japanese Journal of Applied Physics, 43(6), 3831-3837. Lien externe
Jin, Z. F., Laurin, J.-J., & Savaria, Y. Comparison of Propagation Characteristics Between Single and Coupled Mis Interconnect Topologies in Vlsi Circuits [Communication écrite]. Canadian Conference on Electrical and Computer Engineering (CCECE 2003). Lien externe
