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Items where Author is "Branz, Howard M."

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Sheng, S., Sacher, E., Yelon, A., Branz, H. M., & Masson, D. P. (1999, January). Structural changes in a-Si:H studied by X-ray photoemission spectroscopy [Paper]. 1999 MRS Spring Meeting - Symposium A 'Amorphous and Heterogenous Silicon Thin Films: Fundamentals to Devices', San Francisco, CA. Published in Materials Research Society Symposium - Proceedings, 557. External link

Branz, H. M., Yelon, A., & Movaghar, B. (1994). Physics of the Meyer-Neldel Rule in Amorphous Silicon. MRS Proceedings, 336. External link

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