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Collaboration networkThis graph maps the connections between all the collaborators of {}'s publications listed on this page.
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Beaudoin, F., Simard-Normandin, M., & Meunier, M. (1997, June). Metallic contamination from wafer handling [Paper]. Advanced Workshop on Silicon Recombination Lifetime Characterization Methods, Santa Clara, CA, USA. External link
Beaudoin, F. (1997). Caractérisation et enlèvement de la contamination métallique à l'endos des pastilles de silicium [Master's thesis, École Polytechnique de Montréal]. Available
