Félix Beaudoin, Martine Simard-Normandin and Michel Meunier
Paper (1997)
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| Additional Information: | Nom historique du département: Département de génie physique et de génie des matériaux |
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| Department: | Department of Engineering Physics |
| PolyPublie URL: | https://publications.polymtl.ca/29137/ |
| Conference Title: | Advanced Workshop on Silicon Recombination Lifetime Characterization Methods |
| Conference Location: | Santa Clara, CA, USA |
| Conference Date(s): | 1997-06-02 - 1997-06-03 |
| Publisher: | ASME |
| DOI: | 10.1520/stp15707s |
| Official URL: | https://doi.org/10.1520/stp15707s |
| Date Deposited: | 18 Apr 2023 15:22 |
| Last Modified: | 03 Oct 2024 15:23 |
| Cite in APA 7: | Beaudoin, F., Simard-Normandin, M., & Meunier, M. (1997, June). Metallic contamination from wafer handling [Paper]. Advanced Workshop on Silicon Recombination Lifetime Characterization Methods, Santa Clara, CA, USA. https://doi.org/10.1520/stp15707s |
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