<  Back to the Polytechnique Montréal portal

Items where Author is "Alford, N. M."

Up a level
Export as [feed] Atom [feed] RSS 1.0 [feed] RSS 2.0
Group by: Authors | Publication Date | Document subtype | No Grouping
Jump to: Article
Number of items: 1.

Article

Lei, D. Y., Kéna-Cohen, S., Zou, B., Petrov, P. K., Sonnefraud, Y., Breeze, J., Maier, S. A., & Alford, N. M. (2012). Spectroscopic ellipsometry as an optical probe of strain evolution in ferroelectric thin films. Optics Express, 20(4), 4419-4427. External link

List generated on: Fri Jun 5 11:28:22 2026 EDT