Spectroscopic ellipsometry as an optical probe of strain evolution in ferroelectric thin films

D. Y. Lei, Stéphane Kéna-Cohen, B. Zou, P. K. Petrov, Y. Sonnefraud, J. Breeze, S. A. Maier and N. M. Alford

Article (2012)

Document published while its authors were not affiliated with Polytechnique Montréal

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PolyPublie URL:	https://publications.polymtl.ca/15094/
Journal Title:	Optics Express (vol. 20, no. 4)
Publisher:	Optical Society of America
DOI:	10.1364/oe.20.004419
Official URL:	https://doi.org/10.1364/oe.20.004419
Date Deposited:	18 Apr 2023 15:11
Last Modified:	05 Apr 2024 10:55

Cite in APA 7:	Lei, D. Y., Kéna-Cohen, S., Zou, B., Petrov, P. K., Sonnefraud, Y., Breeze, J., Maier, S. A., & Alford, N. M. (2012). Spectroscopic ellipsometry as an optical probe of strain evolution in ferroelectric thin films. Optics Express, 20(4), 4419-4427. https://doi.org/10.1364/oe.20.004419
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