A Monte Carlo code to simulate the effect of fast secondary electrons on κAB factors and spatial resolution in the TEM

Raynald Gauvin and Gilles L'Espérance

Article (1992)

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Department:	Department of Mathematics and Industrial Engineering
PolyPublie URL:	https://publications.polymtl.ca/69820/
Journal Title:	Journal of Microscopy (vol. 168, no. 2)
Publisher:	Wiley
DOI:	10.1111/j.1365-2818.1992.tb03258.x
Official URL:	https://doi.org/10.1111/j.1365-2818.1992.tb03258.x
Date Deposited:	24 Nov 2025 10:12
Last Modified:	24 Nov 2025 10:12

Cite in APA 7:	Gauvin, R., & L'Espérance, G. (1992). A Monte Carlo code to simulate the effect of fast secondary electrons on κAB factors and spatial resolution in the TEM. Journal of Microscopy, 168(2), 153-167. https://doi.org/10.1111/j.1365-2818.1992.tb03258.x
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