Mengzhen Wang, Ruizhi Liu, Weijian Si and Ke Wu
Paper (2025)
An external link is available for this item| Department: | Department of Electrical Engineering |
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| Research Center: | POLY-GRAMES - Advanced Research Centre in Microwaves and Space Electronics |
| PolyPublie URL: | https://publications.polymtl.ca/68149/ |
| Conference Title: | IEEE MTT-S International Microwave Workshop Series On Advanced Materials and Processes for RF and THz Applications (IMWS-AMP 2025) |
| Conference Location: | Wuxi, China |
| Conference Date(s): | 2025-07-23 - 2025-07-26 |
| Publisher: | Institute of Electrical and Electronics Engineers |
| DOI: | 10.1109/imws-amp66175.2025.11136657 |
| Official URL: | https://doi.org/10.1109/imws-amp66175.2025.1113665... |
| Date Deposited: | 02 Sep 2025 13:53 |
| Last Modified: | 02 Sep 2025 13:53 |
| Cite in APA 7: | Wang, M., Liu, R., Si, W., & Wu, K. (2025, July). Radiation Characteristic Prediction by Equivalent Huygens' Source Method [Paper]. IEEE MTT-S International Microwave Workshop Series On Advanced Materials and Processes for RF and THz Applications (IMWS-AMP 2025), Wuxi, China. https://doi.org/10.1109/imws-amp66175.2025.11136657 |
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