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A Machine Learning Based Approach to Detect Machine Learning Design Patterns

Weitao Pan, Hironori Washizaki, Nobukazu Yoshioka, Yoshiaki Fukazawa, Foutse Khomh and Yann-Gaël Gueheneuc

Paper (2023)

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Additional Information: Groupe de recherche: SWAT Lab
Department: Department of Computer Engineering and Software Engineering
Research Center: Other
PolyPublie URL: https://publications.polymtl.ca/58470/
Conference Title: 30th Asia-Pacific Software Engineering Conference (APSEC 2023)
Conference Location: Seoul, Korea, Republic of Seoul
Conference Date(s): 2023-12-04 - 2023-12-07
Publisher: IEEE
DOI: 10.1109/apsec60848.2023.00073
Official URL: https://doi.org/10.1109/apsec60848.2023.00073
Date Deposited: 03 Jun 2024 14:54
Last Modified: 03 Jun 2024 14:54
Cite in APA 7: Pan, W., Washizaki, H., Yoshioka, N., Fukazawa, Y., Khomh, F., & Guéhéneuc, Y.-G. (2023, December). A Machine Learning Based Approach to Detect Machine Learning Design Patterns [Paper]. 30th Asia-Pacific Software Engineering Conference (APSEC 2023), Seoul, Korea, Republic of Seoul. https://doi.org/10.1109/apsec60848.2023.00073

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