Sébastien Delprat, M. Ouaddari, François Vidal, Mohamed Chaker and Ke Wu
Article (2003)
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| Department: | Department of Electrical Engineering |
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| Research Center: | POLY-GRAMES - Advanced Research Centre in Microwaves and Space Electronics |
| PolyPublie URL: | https://publications.polymtl.ca/55771/ |
| Journal Title: | IEEE Microwave and Wireless Components Letters (vol. 13, no. 6) |
| Publisher: | Institute of Electrical and Electronics Engineers |
| DOI: | 10.1109/lmwc.2003.814091 |
| Official URL: | https://doi.org/10.1109/lmwc.2003.814091 |
| Date Deposited: | 02 Oct 2023 08:35 |
| Last Modified: | 25 Sep 2024 16:47 |
| Cite in APA 7: | Delprat, S., Ouaddari, M., Vidal, F., Chaker, M., & Wu, K. (2003). Voltage and frequency dependent dielectric properties of BST-0.5 thin films on alumina substrates. IEEE Microwave and Wireless Components Letters, 13(6), 211-213. https://doi.org/10.1109/lmwc.2003.814091 |
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