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Integrated Raman biopsy probe for high yield targeted brain cancer biopsies (Conference Presentation)

Joannie Desroches, Michael Jermyn, Eric Marple, Kirk Urmey, Gilles Soulez, Marie-Christine Guiot, Brian C. Wilson, Kevin Petrecca, Frédéric Leblond, Tuan Vo-Dinh, Anita Mahadevan-Jansen and Warren S. Grundfest

Presentation (2018)

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Department: Department of Engineering Physics
PolyPublie URL: https://publications.polymtl.ca/52565/
Conference Title: SPIE BiOS
Conference Location: San Francisco, California, United States
Conference Date(s): 2018-01-30 - 2018-02-02
Publisher: SPIE
DOI: 10.1117/12.2290189
Official URL: https://doi.org/10.1117/12.2290189
Date Deposited: 18 Apr 2023 15:03
Last Modified: 25 Sep 2024 16:43
Cite in APA 7: Desroches, J., Jermyn, M., Marple, E., Urmey, K., Soulez, G., Guiot, M.-C., Wilson, B. C., Petrecca, K., Leblond, F., Vo-Dinh, T., Mahadevan-Jansen, A., & Grundfest, W. S. (2018, January). Integrated Raman biopsy probe for high yield targeted brain cancer biopsies (Conference Presentation) [Presentation]. In SPIE BiOS, San Francisco, California, United States. https://doi.org/10.1117/12.2290189

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