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Coupled Broad Ion Beam-Scanning Electron Microscopy (BIB-SEM) for polishing and three dimensional (3D) serial section tomography (SST)

Ali Gholinia, Matthew E. Curd, Étienne Bousser, Kevin Taylor, Thijs Hosman, Steven Coyle, Michael Hassel Shearer, John Hunt and Philip J. Withers

Article (2020)

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Department: Department of Engineering Physics
Research Center: LaRFIS - Functional Coating and Surface Engineering Laboratory
PolyPublie URL: https://publications.polymtl.ca/45962/
Journal Title: Ultramicroscopy (vol. 214)
Publisher: Elsevier
DOI: 10.1016/j.ultramic.2020.112989
Official URL: https://doi.org/10.1016/j.ultramic.2020.112989
Date Deposited: 18 Apr 2023 15:00
Last Modified: 05 Apr 2024 11:45
Cite in APA 7: Gholinia, A., Curd, M. E., Bousser, É., Taylor, K., Hosman, T., Coyle, S., Shearer, M. H., Hunt, J., & Withers, P. J. (2020). Coupled Broad Ion Beam-Scanning Electron Microscopy (BIB-SEM) for polishing and three dimensional (3D) serial section tomography (SST). Ultramicroscopy, 214, UNSP 11298 (13 pages). https://doi.org/10.1016/j.ultramic.2020.112989

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