<  Back to the Polytechnique Montréal portal

Items where Author is "Hunt, John"

Up a level
Export as [feed] Atom [feed] RSS 1.0 [feed] RSS 2.0
Jump to: G | L
Number of items: 2.

G

Gholinia, A., Curd, M. E., Bousser, É., Taylor, K., Hosman, T., Coyle, S., Shearer, M. H., Hunt, J., & Withers, P. J. (2020). Coupled Broad Ion Beam-Scanning Electron Microscopy (BIB-SEM) for polishing and three dimensional (3D) serial section tomography (SST). Ultramicroscopy, 214, UNSP 11298 (13 pages). External link

L

L'Espérance, G., Bailon, J.-P., Sioui-Latulippe, O., Hunt, J., & Gubbens, S. (2016). Design of a HAADF Detector for Z Contrast in SEM. Microscopy and Microanalysis, 22(S3), 622-623. External link

List generated on: Mon Apr 13 09:05:06 2026 EDT