Pierre-Louis M. Brunner, Jean-Philippe Masse, Gilles L'Espérance
and James D. Wuest
Article (2020)
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| Department: | Department of Mathematics and Industrial Engineering |
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| Research Center: | (CM)² - Centre for Characterization and Microscopy of Materials |
| PolyPublie URL: | https://publications.polymtl.ca/45835/ |
| Journal Title: | Canadian Journal of Chemistry (vol. 98, no. 9) |
| Publisher: | Canadian Science Publishing |
| DOI: | 10.1139/cjc-2020-0102 |
| Official URL: | https://doi.org/10.1139/cjc-2020-0102 |
| Date Deposited: | 18 Apr 2023 15:00 |
| Last Modified: | 25 Sep 2024 16:33 |
| Cite in APA 7: | Brunner, P.-L. M., Masse, J.-P., L'Espérance, G., & Wuest, J. D. (2020). Imaging layers in thin-film molecular devices by transmission electron microscopy, using milling by focused ion beams and deposition on NaCl and Si. Canadian Journal of Chemistry, 98(9), 582-588. https://doi.org/10.1139/cjc-2020-0102 |
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