Maximilien Debia, Cyril Catto, Alan Fleck, Jean-Philippe Masse, Gilles L'Espérance
, Brigitte Roberge
Technical Report (2019)
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Report number:
R-1075
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OAI:
oai:publications.polymtl.ca:44086
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Date Deposited:
18 Apr 2023 15:01
Last Modified:
14 Oct 2026 13:56
Cite in APA 7:
Debia, M., Catto, C., Fleck, A., Masse, J.-P., L'Espérance, G., & Roberge, B. (2019). Caractérisation des particules nanométriques non intentionnelles émises dans différents milieux de travail. (Technical Report n° R-1075). https://doi.org/10.70010/ztdf4470
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