Yi Xu, D. Maurin, Ke Wu
, B. Huyart, D. Klemer and Rénato Bosisio
Paper (1993)
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| Department: | Department of Electrical Engineering |
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| ISBN: | 0780356861 |
| PolyPublie URL: | https://publications.polymtl.ca/43921/ |
| Conference Title: | 41st ARFTG Conference Digest - Spring 1993 |
| Conference Location: | Atlanta, GA, United states |
| Conference Date(s): | 1993-06-18 |
| Publisher: | IEEE |
| DOI: | 10.1109/arftg.1993.327020 |
| Official URL: | https://doi.org/10.1109/arftg.1993.327020 |
| Date Deposited: | 18 Apr 2023 15:26 |
| Last Modified: | 08 Apr 2025 07:09 |
| Cite in APA 7: | Xu, Y., Maurin, D., Wu, K., Huyart, B., Klemer, D., & Bosisio, R. (1993, June). On the Design of New Integrated Microprobes (NIMPs) for Non-Linear On-Wafer Device Characterization [Paper]. 41st ARFTG Conference Digest - Spring 1993, Atlanta, GA, United states. https://doi.org/10.1109/arftg.1993.327020 |
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