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Transmission electron microscopy and cathodoluminescence of tensile‐strained GaₓIn₁₋ₓP/InP heterostructures. II. On the origin of luminescence heterogeneities in tensile stress relaxed GaₓIn₁₋ₓP/InP heterostructures

F. Cléton, B. Sieber, A. Bensaada, Rémo A. Masut, J. M. Bonard and J. D. Ganière

Article (1996)

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Department: Department of Engineering Physics
Research Center: GCM - Thin Film Physics and Technology Research Group
PolyPublie URL: https://publications.polymtl.ca/43246/
Journal Title: Journal of Applied Physics (vol. 80, no. 2)
Publisher: American Institute of Physics
DOI: 10.1063/1.362893
Official URL: https://doi.org/10.1063/1.362893
Date Deposited: 18 Apr 2023 15:24
Last Modified: 05 Apr 2024 11:41
Cite in APA 7: Cléton, F., Sieber, B., Bensaada, A., Masut, R. A., Bonard, J. M., & Ganière, J. D. (1996). Transmission electron microscopy and cathodoluminescence of tensile‐strained GaₓIn₁₋ₓP/InP heterostructures. II. On the origin of luminescence heterogeneities in tensile stress relaxed GaₓIn₁₋ₓP/InP heterostructures. Journal of Applied Physics, 80(2), 837-845. https://doi.org/10.1063/1.362893

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