Mohammad Norouzi Banis, Zhiqiang Wang, Steeve Rousselot, Yulong Liu, Yongfeng Hu, Majid Talebi-Esfandarani, Thomas Bibienne, Michel Gauthier, Ruying Li, Guoxian Liang, Mickaël Dollé, Pierre Sauriol, Tsun-Kong Sham and Xueliang Sun
Article (2019)
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| Department: | Department of Chemical Engineering |
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| PolyPublie URL: | https://publications.polymtl.ca/41861/ |
| Journal Title: | Canadian Journal of Chemical Engineering (vol. 97, no. 8) |
| Publisher: | Wiley |
| DOI: | 10.1002/cjce.23430 |
| Official URL: | https://doi.org/10.1002/cjce.23430 |
| Date Deposited: | 18 Apr 2023 15:02 |
| Last Modified: | 08 Apr 2025 07:06 |
| Cite in APA 7: | Norouzi Banis, M., Wang, Z., Rousselot, S., Liu, Y., Hu, Y., Talebi-Esfandarani, M., Bibienne, T., Gauthier, M., Li, R., Liang, G., Dollé, M., Sauriol, P., Sham, T.-K., & Sun, X. (2019). Chemical Speciation and Mapping of the Si in Si Doped LFP Ingot with Synchrotron Radiation Technique. Canadian Journal of Chemical Engineering, 97(8), 2211-2217. https://doi.org/10.1002/cjce.23430 |
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