 | Monter d'un niveau |
Norouzi Banis, M., Wang, Z., Rousselot, S., Liu, Y., Hu, Y., Talebi-Esfandarani, M., Bibienne, T., Gauthier, M., Li, R., Liang, G., Dollé, M., Sauriol, P., Sham, T.-K., & Sun, X. (2019). Chemical Speciation and Mapping of the Si in Si Doped LFP Ingot with Synchrotron Radiation Technique. Canadian Journal of Chemical Engineering, 97(8), 2211-2217. Lien externe
