Gang Xiong, Oussama Moutanabbir, Manfred Reiche, Ross Harder and Ian Robinson
Book Section (2018)
An external link is available for this item| Department: | Department of Engineering Physics |
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| ISBN: | 9783527697106 |
| PolyPublie URL: | https://publications.polymtl.ca/40033/ |
| Editors: | Chunhai Fan and Zhentang Zhao |
| Publisher: | Wiley |
| DOI: | 10.1002/9783527697106.ch8 |
| Official URL: | https://doi.org/10.1002/9783527697106.ch8 |
| Date Deposited: | 18 Apr 2023 15:03 |
| Last Modified: | 08 Apr 2025 12:29 |
| Cite in APA 7: | Xiong, G., Moutanabbir, O., Reiche, M., Harder, R., & Robinson, I. (2018). Investigating strain in silicon-on-insulator nanostructures by coherent X-ray diffraction. In Fan, C., & Zhao, Z. (eds.), Synchrotron radiation in materials science (pp. 239-274). https://doi.org/10.1002/9783527697106.ch8 |
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