A. Raveh, Ludvik Martinu, S. C. Gujrathi, Jolanta-Ewa Sapieha and Michael R. Wertheimer
Article (1992)
An external link is available for this itemDepartment: | Department of Engineering Physics |
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Research Center: | GCM - Thin Film Physics and Technology Research Group |
PolyPublie URL: | https://publications.polymtl.ca/38288/ |
Journal Title: | Surface and Coatings Technology (vol. 53, no. 3) |
Publisher: | Elsevier |
DOI: | 10.1016/0257-8972(92)90386-o |
Official URL: | https://doi.org/10.1016/0257-8972%2892%2990386-o |
Date Deposited: | 18 Apr 2023 15:26 |
Last Modified: | 25 Sep 2024 16:22 |
Cite in APA 7: | Raveh, A., Martinu, L., Gujrathi, S. C., Sapieha, J.-E., & Wertheimer, M. R. (1992). Structure-property relationships in dual-frequency plasma deposited hard a-C : H films. Surface and Coatings Technology, 53(3), 275-282. https://doi.org/10.1016/0257-8972%2892%2990386-o |
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