R. Kressmann, H. Amjadi, G. M. Sessler, D. Rats, Ludvik Martinu
, Jolanta-Ewa Sapieha and Michael R. Wertheimer
Paper (1998)
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| Department: | Department of Engineering Physics |
|---|---|
| PolyPublie URL: | https://publications.polymtl.ca/38271/ |
| Conference Title: | Annual Report Conference on Electrical Insulation and Dielectric Phenomena |
| Conference Location: | Atlanta, GA, USA |
| Conference Date(s): | 1998-10-25 - 1998-10-28 |
| Publisher: | IEEE |
| DOI: | 10.1109/ceidp.1998.732970 |
| Official URL: | https://doi.org/10.1109/ceidp.1998.732970 |
| Date Deposited: | 18 Apr 2023 15:23 |
| Last Modified: | 08 Apr 2025 07:01 |
| Cite in APA 7: | Kressmann, R., Amjadi, H., Sessler, G. M., Rats, D., Martinu, L., Sapieha, J.-E., & Wertheimer, M. R. (1998, October). Charge storage in PECVD silicon oxynitride layers [Paper]. Annual Report Conference on Electrical Insulation and Dielectric Phenomena, Atlanta, GA, USA. https://doi.org/10.1109/ceidp.1998.732970 |
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