M. Beaudoin, C. J. Arsenault, R. Izquierdo and Michel Meunier
Article (1989)
An external link is available for this itemDepartment: | Department of Engineering Physics |
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Research Center: | GCM - Thin Film Physics and Technology Research Group |
PolyPublie URL: | https://publications.polymtl.ca/35692/ |
Journal Title: | Applied Physics Letters (vol. 55, no. 25) |
Publisher: | American Institute of Physics |
DOI: | 10.1063/1.102299 |
Official URL: | https://doi.org/10.1063/1.102299 |
Date Deposited: | 18 Apr 2023 15:26 |
Last Modified: | 25 Sep 2024 16:19 |
Cite in APA 7: | Beaudoin, M., Arsenault, C. J., Izquierdo, R., & Meunier, M. (1989). Interface study of hydrogenated amorphous silicon nitride on hydrogenated amorphous silicon by X-ray photoelectron spectroscopy. Applied Physics Letters, 55(25), 2640-2640. https://doi.org/10.1063/1.102299 |
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