Ammar B. Kouki, Ahmed Khebir, Rénato Bosisio and Fadhel M. Ghannouchi
Article (1994)
An external link is available for this item| Additional Information: | Nom historique du département: Département de génie électrique et de génie informatique |
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| Department: |
Department of Electrical Engineering Department of Computer Engineering and Software Engineering |
| PolyPublie URL: | https://publications.polymtl.ca/33151/ |
| Journal Title: | IEEE Transactions on Microwave Theory and Techniques (vol. 42, no. 1) |
| Publisher: | IEEE |
| DOI: | 10.1109/22.265531 |
| Official URL: | https://doi.org/10.1109/22.265531 |
| Date Deposited: | 18 Apr 2023 15:25 |
| Last Modified: | 08 Apr 2025 06:54 |
| Cite in APA 7: | Kouki, A. B., Khebir, A., Bosisio, R., & Ghannouchi, F. M. (1994). Novel technique for the analysis of dielectric height variations in microstrip circuits. IEEE Transactions on Microwave Theory and Techniques, 42(1), 73-77. https://doi.org/10.1109/22.265531 |
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