C. S. Sundararaman, P. Milhelich, Rémo A. Masut and John F. Currie
Article (1994)
An external link is available for this itemDepartment: | Department of Engineering Physics |
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PolyPublie URL: | https://publications.polymtl.ca/32824/ |
Journal Title: | Applied Physics Letters (vol. 64, no. 17) |
Publisher: | American Institute of Physics |
DOI: | 10.1063/1.111643 |
Official URL: | https://doi.org/10.1063/1.111643 |
Date Deposited: | 18 Apr 2023 15:25 |
Last Modified: | 25 Sep 2024 16:15 |
Cite in APA 7: | Sundararaman, C. S., Milhelich, P., Masut, R. A., & Currie, J. F. (1994). Conductance study of silicon nitride/InP capacitors with an In₂S₃ interface control layer. Applied Physics Letters, 64(17), 2279-2281. https://doi.org/10.1063/1.111643 |
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