<  Back to the Polytechnique Montréal portal

Conductance study of silicon nitride/InP capacitors with an In₂S₃ interface control layer

C. S. Sundararaman, P. Milhelich, Rémo A. Masut and John F. Currie

Article (1994)

An external link is available for this item
Department: Department of Engineering Physics
PolyPublie URL: https://publications.polymtl.ca/32824/
Journal Title: Applied Physics Letters (vol. 64, no. 17)
Publisher: American Institute of Physics
DOI: 10.1063/1.111643
Official URL: https://doi.org/10.1063/1.111643
Date Deposited: 18 Apr 2023 15:25
Last Modified: 05 Apr 2024 11:23
Cite in APA 7: Sundararaman, C. S., Milhelich, P., Masut, R. A., & Currie, J. F. (1994). Conductance study of silicon nitride/InP capacitors with an In₂S₃ interface control layer. Applied Physics Letters, 64(17), 2279-2281. https://doi.org/10.1063/1.111643

Statistics

Dimensions

Repository Staff Only

View Item View Item