Conductance study of silicon nitride/InP capacitors with an In₂S₃ interface control layer

C. S. Sundararaman, P. Milhelich, Rémo A. Masut, John F. Currie

Article (1994)

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Department:
Department of Engineering Physics
PolyPublie URL:
https://publications.polymtl.ca/32824/
Journal Title :
Applied Physics Letters ( vol. 64 , no. 17 )
Publisher:
American Institute of Physics
DOI:
10.1063/1.111643
Official URL:
https://doi.org/10.1063/1.111643
OAI:
oai:publications.polymtl.ca:32824
ORCID
Date Deposited:
18 Apr 2023 15:25
Last Modified:
08 Oct 2026 17:43
Cite in APA 7:
Sundararaman, C. S., Milhelich, P., Masut, R. A., & Currie, J. F. (1994). Conductance study of silicon nitride/InP capacitors with an In₂S₃ interface control layer. Applied Physics Letters, 64(17), 2279-2281. https://doi.org/10.1063/1.111643

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