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GaAs FET's gate current behavior and its effects on RF performance and reliability in SSPA's

Nicolas Constantin and Fadhel M. Ghannouchi

Article (1995)

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Additional Information: Nom historique du département: Département de génie électrique et de génie informatique
Department: Department of Electrical Engineering
Department of Computer Engineering and Software Engineering
PolyPublie URL: https://publications.polymtl.ca/32419/
Journal Title: IEEE Transactions on Microwave Theory and Techniques (vol. 43, no. 12, pt 2)
Publisher: IEEE
DOI: 10.1109/22.475656
Official URL: https://doi.org/10.1109/22.475656
Date Deposited: 18 Apr 2023 15:24
Last Modified: 08 Apr 2025 06:53
Cite in APA 7: Constantin, N., & Ghannouchi, F. M. (1995). GaAs FET's gate current behavior and its effects on RF performance and reliability in SSPA's. IEEE Transactions on Microwave Theory and Techniques, 43(12, pt 2), 2918-2925. https://doi.org/10.1109/22.475656

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