Fadhel M. Ghannouchi, Guoxiang Zhao and François Beauregard
Article (1995)
An external link is available for this item| Additional Information: | Nom historique du département: Département de génie électrique et de génie informatique |
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| Department: |
Department of Electrical Engineering Department of Computer Engineering and Software Engineering |
| PolyPublie URL: | https://publications.polymtl.ca/32248/ |
| Journal Title: | IEEE Transactions on Microwave Theory and Techniques (vol. 43, no. 7, pt. 1) |
| Publisher: | IEEE |
| DOI: | 10.1109/22.392918 |
| Official URL: | https://doi.org/10.1109/22.392918 |
| Date Deposited: | 18 Apr 2023 15:24 |
| Last Modified: | 08 Apr 2025 06:53 |
| Cite in APA 7: | Ghannouchi, F. M., Zhao, G., & Beauregard, F. (1995). Simultaneous AM-AM/AM-PM distortion measurements of microwave transistors using active load-pull and six-port techniques. IEEE Transactions on Microwave Theory and Techniques, 43(7, pt. 1), 1584-1588. https://doi.org/10.1109/22.392918 |
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