C. Vailles, R. Malewski, Xuan-Dai Do and J. Aubin
Article (1995)
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| Additional Information: | Nom historique du département: Département de génie électrique et de génie informatique |
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| Department: |
Department of Electrical Engineering Department of Computer Engineering and Software Engineering |
| PolyPublie URL: | https://publications.polymtl.ca/31656/ |
| Journal Title: | IEEE Transactions on Power Delivery (vol. 10, no. 4) |
| Publisher: | IEEE |
| DOI: | 10.1109/61.473383 |
| Official URL: | https://doi.org/10.1109/61.473383 |
| Date Deposited: | 18 Apr 2023 15:25 |
| Last Modified: | 18 Apr 2023 15:25 |
| Cite in APA 7: | Vailles, C., Malewski, R., Do, X.-D., & Aubin, J. (1995). Measurements of dielectric stress in ehv power transformer insulation. IEEE Transactions on Power Delivery, 10(4), 1757-1763. https://doi.org/10.1109/61.473383 |
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