Gregory Garth Kennedy, J. St-Pierre, J. Guo, F. Gitzhofer and M. Boulos
Paper (1995)
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| Department: | Department of Mechanical Engineering |
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| PolyPublie URL: | https://publications.polymtl.ca/31182/ |
| Conference Title: | 3rd International Workshop on Short-Time Activation Analysis, High-Rate Gamma Spectroscopy, and X-Ray Techniques |
| Conference Location: | Vienna, Austria |
| Conference Date(s): | 1995-04-03 |
| Journal Title: | Journal of trace and microprobe techniques (vol. 14, no. 1) |
| Date Deposited: | 18 Apr 2023 15:24 |
| Last Modified: | 25 Sep 2024 16:13 |
| Cite in APA 7: | Kennedy, G. G., St-Pierre, J., Guo, J., Gitzhofer, F., & Boulos, M. (1995, April). Boron determination in SiC using two INAA techniques [Paper]. 3rd International Workshop on Short-Time Activation Analysis, High-Rate Gamma Spectroscopy, and X-Ray Techniques, Vienna, Austria. Published in Journal of trace and microprobe techniques, 14(1). |
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