A self-consistent technique for the analysis of the temperature dependence of current-voltage and capacitance-voltage characteristics of a tunnel metal-insulator-semiconductor structure

P. Cova, A. Singh and Rémo A. Masut

Article (1997)

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Department:	Department of Engineering Physics
Research Center:	GCM - Thin Film Physics and Technology Research Group
PolyPublie URL:	https://publications.polymtl.ca/30558/
Journal Title:	Journal of Applied Physics (vol. 82, no. 10)
Publisher:	American Institute of Physics
DOI:	10.1063/1.366386
Official URL:	https://doi.org/10.1063/1.366386
Date Deposited:	18 Apr 2023 15:23
Last Modified:	25 Sep 2024 16:12

Cite in APA 7:	Cova, P., Singh, A., & Masut, R. A. (1997). A self-consistent technique for the analysis of the temperature dependence of current-voltage and capacitance-voltage characteristics of a tunnel metal-insulator-semiconductor structure. Journal of Applied Physics, 82(10), 5217-5226. https://doi.org/10.1063/1.366386
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