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A self-consistent technique for the analysis of the temperature dependence of current-voltage and capacitance-voltage characteristics of a tunnel metal-insulator-semiconductor structure

P. Cova, A. Singh and Rémo A. Masut

Article (1997)

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Department: Department of Engineering Physics
PolyPublie URL: https://publications.polymtl.ca/30558/
Journal Title: Journal of Applied Physics (vol. 82, no. 10)
Publisher: American Institute of Physics
DOI: 10.1063/1.366386
Official URL: https://doi.org/10.1063/1.366386
Date Deposited: 18 Apr 2023 15:23
Last Modified: 05 Apr 2024 11:20
Cite in APA 7: Cova, P., Singh, A., & Masut, R. A. (1997). A self-consistent technique for the analysis of the temperature dependence of current-voltage and capacitance-voltage characteristics of a tunnel metal-insulator-semiconductor structure. Journal of Applied Physics, 82(10), 5217-5226. https://doi.org/10.1063/1.366386

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