Carl Blais, Gilles L'Espérance and É. Baril
Article (1998)
An external link is available for this item| Additional Information: | Nom historique du département: Département de génie physique et de génie des matériaux |
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| Department: | Department of Engineering Physics |
| Research Center: | (CM)² - Centre for Characterization and Microscopy of Materials |
| PolyPublie URL: | https://publications.polymtl.ca/29837/ |
| Journal Title: | Journal of Microscopy (vol. 189, no. 3) |
| Publisher: | Blackwell Publishing |
| DOI: | 10.1046/j.1365-2818.1998.00303.x |
| Official URL: | https://doi.org/10.1046/j.1365-2818.1998.00303.x |
| Date Deposited: | 18 Apr 2023 15:22 |
| Last Modified: | 25 Sep 2024 16:11 |
| Cite in APA 7: | Blais, C., L'Espérance, G., & Baril, É. (1998). Characterization of 25-75 nm phases found at the peripyhery of multiphase inclusions: techniques comparison and selection. Journal of Microscopy, 189(3), 249-262. https://doi.org/10.1046/j.1365-2818.1998.00303.x |
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