Daniel Poitras and Ludvik Martinu
Article (1998)
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| Additional Information: | Nom historique du département: Département de génie physique et de génie des matériaux |
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| Department: | Department of Engineering Physics |
| Research Center: | GCM - Thin Film Physics and Technology Research Group |
| PolyPublie URL: | https://publications.polymtl.ca/29409/ |
| Journal Title: | Applied Optics (vol. 37, no. 19) |
| Publisher: | Optical Society of America |
| DOI: | 10.1364/ao.37.004160 |
| Official URL: | https://doi.org/10.1364/ao.37.004160 |
| Date Deposited: | 18 Apr 2023 15:23 |
| Last Modified: | 25 Sep 2024 16:10 |
| Cite in APA 7: | Poitras, D., & Martinu, L. (1998). Simple Method for Determining Slowly Varying Refractive-Index Profiles From in Situ Spectrophotometric Measurements. Applied Optics, 37(19), 4160-4167. https://doi.org/10.1364/ao.37.004160 |
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