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Simple Method for Determining Slowly Varying Refractive-Index Profiles From in Situ Spectrophotometric Measurements

D. Poitras and Ludvik Martinu

Article (1998)

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Additional Information: Nom historique du département: Département de génie physique et de génie des matériaux
Department: Department of Engineering Physics
PolyPublie URL: https://publications.polymtl.ca/29409/
Journal Title: Applied Optics (vol. 37, no. 19)
Publisher: Optical Society of America
DOI: 10.1364/ao.37.004160
Official URL: https://doi.org/10.1364/ao.37.004160
Date Deposited: 18 Apr 2023 15:23
Last Modified: 05 Apr 2024 11:18
Cite in APA 7: Poitras, D., & Martinu, L. (1998). Simple Method for Determining Slowly Varying Refractive-Index Profiles From in Situ Spectrophotometric Measurements. Applied Optics, 37(19), 4160-4167. https://doi.org/10.1364/ao.37.004160

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