D. Popovici, Edward Sacher and Michel Meunier
Article (1998)
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| Additional Information: | Nom historique du département: Département de génie physique et de génie des matériaux |
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| Department: | Department of Engineering Physics |
| PolyPublie URL: | https://publications.polymtl.ca/29403/ |
| Journal Title: | Journal of Applied Polymer Science (vol. 70, no. 6) |
| Publisher: | Wiley |
| DOI: | 10.1002/(sici)1097-4628(19981107)70:6<1201::aid-app17>3.0.co;2-1 |
| Official URL: | https://doi.org/10.1002/%28sici%291097-4628%281998... |
| Date Deposited: | 18 Apr 2023 15:23 |
| Last Modified: | 25 Sep 2024 16:10 |
| Cite in APA 7: | Popovici, D., Sacher, E., & Meunier, M. (1998). Photodegradation of Teflon AF1600 During XPS Analysis. Journal of Applied Polymer Science, 70(6), 1201-1207. https://doi.org/10.1002/%28sici%291097-4628%2819981107%2970%3a6%3c1201%3a%3aaid-app17%3e3.0.co%3b2-1 |
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