Yansheng Xu and Rénato Bosisio
Article (1998)
An external link is available for this itemAdditional Information: | Nom historique du département: Département de génie électrique et de génie informatique |
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Department: |
Department of Electrical Engineering Department of Computer Engineering and Software Engineering |
Research Center: | POLY-GRAMES - Advanced Research Centre in Microwaves and Space Electronics |
PolyPublie URL: | https://publications.polymtl.ca/29234/ |
Journal Title: | Microwave and Optical Technology Letters (vol. 19, no. 1) |
Publisher: | Wiley |
DOI: | 10.1002/(sici)1098-2760(199809)19:1<27::aid-mop7>3.0.co;2-j |
Official URL: | https://doi.org/10.1002/%28sici%291098-2760%281998... |
Date Deposited: | 18 Apr 2023 15:23 |
Last Modified: | 25 Sep 2024 16:10 |
Cite in APA 7: | Xu, Y., & Bosisio, R. (1998). Effects of local oscillator leakage in digital millimetric six-port receivers (SPRs). Microwave and Optical Technology Letters, 19(1), 27-34. https://doi.org/10.1002/%28sici%291098-2760%28199809%2919%3a1%3c27%3a%3aaid-mop7%3e3.0.co%3b2-j |
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