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Effect of interface roughness and well width on differential reflection dynamics in InGaAs/InP quantum wells

Y. G. Zhao, Y. H. Zou, J. J. Wang, Y. D. Qin, X. L. Huang, Rémo A. Masut and A. Bensaada

Article (1998)

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Additional Information: Nom historique du département: Département de génie physique et de génie des matériaux
Department: Department of Engineering Physics
Research Center: GCM - Thin Film Physics and Technology Research Group
PolyPublie URL: https://publications.polymtl.ca/29214/
Journal Title: Applied Physics Letters (vol. 72, no. 1)
Publisher: American Institute of Physics
DOI: 10.1063/1.120656
Official URL: https://doi.org/10.1063/1.120656
Date Deposited: 18 Apr 2023 15:23
Last Modified: 05 Apr 2024 11:17
Cite in APA 7: Zhao, Y. G., Zou, Y. H., Wang, J. J., Qin, Y. D., Huang, X. L., Masut, R. A., & Bensaada, A. (1998). Effect of interface roughness and well width on differential reflection dynamics in InGaAs/InP quantum wells. Applied Physics Letters, 72(1), 97-99. https://doi.org/10.1063/1.120656

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