Y. G. Zhao, Y. H. Zou, J. J. Wang, Y. D. Qin, X. L. Huang, Rémo A. Masut
and A. Bensaada
Article (1998)
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| Additional Information: | Nom historique du département: Département de génie physique et de génie des matériaux |
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| Department: | Department of Engineering Physics |
| Research Center: | GCM - Thin Film Physics and Technology Research Group |
| PolyPublie URL: | https://publications.polymtl.ca/29214/ |
| Journal Title: | Applied Physics Letters (vol. 72, no. 1) |
| Publisher: | American Institute of Physics |
| DOI: | 10.1063/1.120656 |
| Official URL: | https://doi.org/10.1063/1.120656 |
| Date Deposited: | 18 Apr 2023 15:23 |
| Last Modified: | 25 Sep 2024 16:10 |
| Cite in APA 7: | Zhao, Y. G., Zou, Y. H., Wang, J. J., Qin, Y. D., Huang, X. L., Masut, R. A., & Bensaada, A. (1998). Effect of interface roughness and well width on differential reflection dynamics in InGaAs/InP quantum wells. Applied Physics Letters, 72(1), 97-99. https://doi.org/10.1063/1.120656 |
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