A. Bergeron, D. Poitras and Ludvik Martinu
Article (2000)
An external link is available for this itemAdditional Information: | Nom historique du département: Département de génie physique et de génie des matériaux |
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Department: | Department of Engineering Physics |
PolyPublie URL: | https://publications.polymtl.ca/28353/ |
Journal Title: | Optical Engineering (vol. 39, no. 3) |
Publisher: | SPIE - International Society for Optical Engineering |
DOI: | 10.1117/1.602433 |
Official URL: | https://doi.org/10.1117/1.602433 |
Date Deposited: | 18 Apr 2023 15:21 |
Last Modified: | 25 Sep 2024 16:09 |
Cite in APA 7: | Bergeron, A., Poitras, D., & Martinu, L. (2000). Interphase in Plasma-Deposited Silicon Nitride Optical Films on Polycarbonate: in Situ Ellipsometric Characterization. Optical Engineering, 39(3), 825-831. https://doi.org/10.1117/1.602433 |
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