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Spectroellipsometric characterization of plasma-deposited Au/SiO₂ nanocomposite films

Dan Dalacu and Ludvik Martinu

Article (2000)

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Additional Information: Nom historique du département: Département de génie physique et de génie des matériaux
Department: Department of Engineering Physics
PolyPublie URL: https://publications.polymtl.ca/28251/
Journal Title: Journal of Applied Physics (vol. 87, no. 1)
Publisher: American Institute of Physics
DOI: 10.1063/1.371849
Official URL: https://doi.org/10.1063/1.371849
Date Deposited: 18 Apr 2023 15:21
Last Modified: 05 Apr 2024 11:16
Cite in APA 7: Dalacu, D., & Martinu, L. (2000). Spectroellipsometric characterization of plasma-deposited Au/SiO₂ nanocomposite films. Journal of Applied Physics, 87(1), 228-235. https://doi.org/10.1063/1.371849

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