Article (2000)
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| Additional Information: | Nom historique du département: Département de génie physique et de génie des matériaux |
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| Department: | Department of Engineering Physics |
| Research Center: | GCM - Thin Film Physics and Technology Research Group |
| PolyPublie URL: | https://publications.polymtl.ca/28251/ |
| Journal Title: | Journal of Applied Physics (vol. 87, no. 1) |
| Publisher: | American Institute of Physics |
| DOI: | 10.1063/1.371849 |
| Official URL: | https://doi.org/10.1063/1.371849 |
| Date Deposited: | 18 Apr 2023 15:21 |
| Last Modified: | 25 Sep 2024 16:09 |
| Cite in APA 7: | Dalacu, D., & Martinu, L. (2000). Spectroellipsometric characterization of plasma-deposited Au/SiO₂ nanocomposite films. Journal of Applied Physics, 87(1), 228-235. https://doi.org/10.1063/1.371849 |
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