Slim Boumaiza, Fadhel M. Ghannouchi
Paper (2002)
Access this document
External link
An external link is available for this item
Department:
PolyPublie URL:
Conference Title:
IEEE MTT-S International Microwave Symposium (IMS 2002)
Conference Location:
Seattle, WA, USA
Conference Date(s):
2002-06-02 - 2002-06-07
Publisher:
Institute of Electrical and Electronics Engineers
Official URL:
OAI:
oai:publications.polymtl.ca:26815
ORCID
Date Deposited:
18 Apr 2023 15:20
Last Modified:
14 Oct 2026 13:02
Cite in APA 7:
Boumaiza, S., & Ghannouchi, F. M. (2002, June). An Accurate complex behavior test suitable for 3G power amplifiers characterization [Paper]. IEEE MTT-S International Microwave Symposium (IMS 2002), Seattle, WA, USA. https://doi.org/10.1109/mwsym.2002.1012319
Statistics
Dimensions
