S. Boumaiza and Fadhel M. Ghannouchi
Paper (2002)
An external link is available for this item
| Department: | Department of Electrical Engineering |
|---|---|
| PolyPublie URL: | https://publications.polymtl.ca/26815/ |
| Conference Title: | IEEE MTT-S International Microwave Symposium (IMS 2002) |
| Conference Location: | Seattle, USA |
| Conference Date(s): | 2002-01-01 - 2002-12-31 |
| Publisher: | Institute of Electrical and Electronics Engineers |
| DOI: | 10.1109/mwsym.2002.1012319 |
| Official URL: | https://doi.org/10.1109/mwsym.2002.1012319 |
| Date Deposited: | 18 Apr 2023 15:20 |
| Last Modified: | 05 May 2023 15:32 |
| Cite in APA 7: | Boumaiza, S., & Ghannouchi, F. M. (2002, January). An Accurate complex behavior test suitable for 3G power amplifiers characterization [Paper]. IEEE MTT-S International Microwave Symposium (IMS 2002), Seattle, USA. https://doi.org/10.1109/mwsym.2002.1012319 |
|---|---|
Statistics
Dimensions
Repository Staff Only
|
View Item |
