Slim Boumaiza and Fadhel M. Ghannouchi
Paper (2002)
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| Department: | Department of Electrical Engineering |
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| Research Center: | POLY-GRAMES - Advanced Research Centre in Microwaves and Space Electronics |
| PolyPublie URL: | https://publications.polymtl.ca/26815/ |
| Conference Title: | IEEE MTT-S International Microwave Symposium (IMS 2002) |
| Conference Location: | Seattle, WA, USA |
| Conference Date(s): | 2002-06-02 - 2002-06-07 |
| Publisher: | Institute of Electrical and Electronics Engineers |
| DOI: | 10.1109/mwsym.2002.1012319 |
| Official URL: | https://doi.org/10.1109/mwsym.2002.1012319 |
| Date Deposited: | 18 Apr 2023 15:20 |
| Last Modified: | 08 Apr 2025 02:16 |
| Cite in APA 7: | Boumaiza, S., & Ghannouchi, F. M. (2002, June). An Accurate complex behavior test suitable for 3G power amplifiers characterization [Paper]. IEEE MTT-S International Microwave Symposium (IMS 2002), Seattle, WA, USA. https://doi.org/10.1109/mwsym.2002.1012319 |
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