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Characterization by RbS of Hyper-Thin SiO₂ Layers on Various Polymers

G. Dennler, A. Houdayer, P. Raynaud, Y. Segui and Michael R. Wertheimer

Article (2002)

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Department: Department of Engineering Physics
PolyPublie URL: https://publications.polymtl.ca/26700/
Journal Title: Nuclear Instruments & Methods in Physics Research. Section B, Beam Interactions With Materials and Atoms (vol. 192, no. 4)
Publisher: Elsevier
DOI: 10.1016/s0168-583x(02)00492-5
Official URL: https://doi.org/10.1016/s0168-583x%2802%2900492-5
Date Deposited: 18 Apr 2023 15:20
Last Modified: 05 Apr 2024 11:13
Cite in APA 7: Dennler, G., Houdayer, A., Raynaud, P., Segui, Y., & Wertheimer, M. R. (2002). Characterization by RbS of Hyper-Thin SiO₂ Layers on Various Polymers. Nuclear Instruments & Methods in Physics Research. Section B, Beam Interactions With Materials and Atoms, 192(4), 420-428. https://doi.org/10.1016/s0168-583x%2802%2900492-5

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