G. Dennler, A. Houdayer, P. Raynaud, Y. Ségui and Michael R. Wertheimer
Article (2002)
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| Department: | Department of Engineering Physics |
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| Research Center: | GCM - Thin Film Physics and Technology Research Group |
| PolyPublie URL: | https://publications.polymtl.ca/26700/ |
| Journal Title: | Nuclear Instruments & Methods in Physics Research. Section B, Beam Interactions With Materials and Atoms (vol. 192, no. 4) |
| Publisher: | Elsevier |
| DOI: | 10.1016/s0168-583x(02)00492-5 |
| Official URL: | https://doi.org/10.1016/s0168-583x%2802%2900492-5 |
| Date Deposited: | 18 Apr 2023 15:20 |
| Last Modified: | 08 Apr 2025 02:15 |
| Cite in APA 7: | Dennler, G., Houdayer, A., Raynaud, P., Ségui, Y., & Wertheimer, M. R. (2002). Characterization by RbS of Hyper-Thin SiO₂ Layers on Various Polymers. Nuclear Instruments & Methods in Physics Research. Section B, Beam Interactions With Materials and Atoms, 192(4), 420-428. https://doi.org/10.1016/s0168-583x%2802%2900492-5 |
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