Thierry M. Lavoie and Ettore Merlo
Technical Report (2011)
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Abstract
This paper presents an original technique for clone detection with metric trees using Levenshtein distance as the metric defined between two code fragments. This approach achieves a faster empirical performance. The resulting clones may be found with varying thresholds allowing type 3 clone detection. Experimental results of metric trees performance as well as clone detection statistics on an open source system are presented and give promising perspectives.
| Subjects: |
2700 Information technology > 2705 Software and development 2700 Information technology > 2706 Software engineering |
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| Department: | Department of Computer Engineering and Software Engineering |
| Funders: | CRSNG/NSERC |
| PolyPublie URL: | https://publications.polymtl.ca/2638/ |
| Report number: | EPM-RT-2011-01 |
| Date Deposited: | 06 Oct 2017 13:37 |
| Last Modified: | 26 Apr 2023 21:53 |
| Cite in APA 7: | Lavoie, T. M., & Merlo, E. (2011). Levenshtein edit distance-based type III clone detection using metric trees. (Technical Report n° EPM-RT-2011-01). https://publications.polymtl.ca/2638/ |
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