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Short-Open Calibration Technique for Field Theory-Based Parameter Extraction of Lumped Elements of Planar Integrated Circuits

L. Zhu and Ke Wu

Article (2002)

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Department: Department of Electrical Engineering
PolyPublie URL: https://publications.polymtl.ca/26167/
Journal Title: IEEE Transactions on Microwave Theory and Techniques (vol. 50, no. 8)
Publisher: Institute of Electrical and Electronics Engineers
DOI: 10.1109/tmtt.2002.801311
Official URL: https://doi.org/10.1109/tmtt.2002.801311
Date Deposited: 18 Apr 2023 15:21
Last Modified: 05 Apr 2024 11:12
Cite in APA 7: Zhu, L., & Wu, K. (2002). Short-Open Calibration Technique for Field Theory-Based Parameter Extraction of Lumped Elements of Planar Integrated Circuits. IEEE Transactions on Microwave Theory and Techniques, 50(8), 1861-1869. https://doi.org/10.1109/tmtt.2002.801311

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