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The applicability of angle-resolved XPS to the characterization of clusters on surfaces

K. N. Piyakis, D.-Q. Yang and Edward Sacher

Article (2003)

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Department: Department of Engineering Physics
PolyPublie URL: https://publications.polymtl.ca/25582/
Journal Title: Surface Science (vol. 536, no. 1-3)
Publisher: Elsevier
DOI: 10.1016/s0039-6028(03)00571-5
Official URL: https://doi.org/10.1016/s0039-6028%2803%2900571-5
Date Deposited: 18 Apr 2023 15:20
Last Modified: 18 Apr 2024 14:57
Cite in APA 7: Piyakis, K. N., Yang, D.-Q., & Sacher, E. (2003). The applicability of angle-resolved XPS to the characterization of clusters on surfaces. Surface Science, 536(1-3), 139-144. https://doi.org/10.1016/s0039-6028%2803%2900571-5

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