K. N. Piyakis, D.-Q. Yang and Edward Sacher
Article (2003)
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| Department: | Department of Engineering Physics |
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| PolyPublie URL: | https://publications.polymtl.ca/25582/ |
| Journal Title: | Surface Science (vol. 536, no. 1-3) |
| Publisher: | Elsevier |
| DOI: | 10.1016/s0039-6028(03)00571-5 |
| Official URL: | https://doi.org/10.1016/s0039-6028%2803%2900571-5 |
| Date Deposited: | 18 Apr 2023 15:20 |
| Last Modified: | 25 Sep 2024 16:05 |
| Cite in APA 7: | Piyakis, K. N., Yang, D.-Q., & Sacher, E. (2003). The applicability of angle-resolved XPS to the characterization of clusters on surfaces. Surface Science, 536(1-3), 139-144. https://doi.org/10.1016/s0039-6028%2803%2900571-5 |
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